The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2014
Filed:
Oct. 31, 2008
Mitsuhiro Yoneda, Kyoto, JP;
Hiroshi Nakajima, Kyoyo, JP;
Naoki Tsuchiya, Kyoto, JP;
Hiroshi Tasaki, Kyoto, JP;
Mitsuhiro Yoneda, Kyoto, JP;
Hiroshi Nakajima, Kyoyo, JP;
Naoki Tsuchiya, Kyoto, JP;
Hiroshi Tasaki, Kyoto, JP;
Omron Corporation, Kyoto, JP;
Abstract
A feature parameter candidate generation apparatus has a storage unit that stores the values of feature parameters extracted from each of samples, an index value calculation unit that calculates an index value, which is obtained by normalizing the number of the kinds of the values of feature parameters by the number of the samples, for each of the feature parameters, an evaluation object selection unit that selects combinations of feature parameters which are objects to be evaluated, an evaluation unit that evaluates whether the uniformity of a frequency distribution of index values of the individual feature parameters for combinations of feature parameters selected as the objects to be evaluated satisfies a predetermined criterion, and a candidate determination unit that determines, as feature parameter candidates to be given to the model generation device, a combination of feature parameters that is evaluated to satisfy the predetermined criterion.