The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2014

Filed:

Aug. 12, 2009
Applicants:

Hendrik F. Hamann, Yorktown Heights, NY (US);

Jon Lenchner, Hawthorne, NY (US);

Andrew Stepanchuk, Wappingers Falls, NY (US);

Inventors:

Hendrik F. Hamann, Yorktown Heights, NY (US);

Jon Lenchner, Hawthorne, NY (US);

Andrew Stepanchuk, Wappingers Falls, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for implementing system best practices are provided. In one aspect, a method for monitoring, modeling and managing a physical system is provided. The method includes the following steps. A physical data model of the physical system is provided. Real time data is obtained from the physical system. The physical data model is updated based on the real time data. An analytic model of the physical system is created based on the updated physical data model. Operation of the physical system is controlled based on output from the analytic model.


Find Patent Forward Citations

Hamann, Hendrik. (2014). Measurement and management technology platform (U.S. Patent No. 8630724). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8630724

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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