The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2014
Filed:
Jul. 11, 2011
Jianfeng Weng, Kanata, CA;
Jason Robert Duggan, Ottawa, CA;
Timothy James Creasy, Ottawa, CA;
BlackBerry Limited, Waterloo, CA;
Abstract
Aspects of the present application include using adaptive measurement intervals to improve RSSI scan accuracy. A method may involve determining a first power value in respect of a first measurement time interval, determining whether or not the first power value meets at least one criterion, when the first power value does not meet the at least one criterion, determining at least one additional power value, selecting at least one power value from a set of power values that have been determined, the set including the first power value and the at least one additional power value, and determining the power value for use in cell selection or cell re-selection based on the selected at least one power value. The methods may be applied to any cell selection or re-selection scheme for which an adaptive measurement interval may be beneficial.