The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2014
Filed:
Sep. 27, 2011
Chih-kuang Chang, New Taipei, TW;
Xin-yuan Wu, Shenzhen, CN;
Wei-quan Wu, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Abstract
A method outputs measurement data automatically using an electronic device. The method obtains measurement data of feature elements from a two dimensional (2D) image of a measured object, determines a type of measurement applied to each feature element, obtains feature elements from planes of a three dimensional (3D) image of the measured object, and maps each of the obtained feature elements in the 3D image to the 2D image. The method further obtains sequential marked numbers from the 2D image, determines a feature element which is nearest to any marked number from the mapped feature elements, determines an output axis for each of the determined feature elements, and outputs measured results and measurement codes of the determined feature elements by reference to the measurement data, the type of measurement and the output axis of each determined feature element.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile