The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2014
Filed:
Feb. 03, 2011
Masakuni Okada, Tokyo, JP;
Yumi Mori, Tokyo, JP;
Munehiro Doi, Tokyo, JP;
Shinsuke Ueyama, Tokyo, JP;
Masakuni Okada, Tokyo, JP;
Yumi Mori, Tokyo, JP;
Munehiro Doi, Tokyo, JP;
Shinsuke Ueyama, Tokyo, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system, and methods of operation thereof, is presented that permits determination of a defect in an inspection subject by means of processing an image of said inspection subject, which system avoids exhaustion of bandwidth in a communication line connected to the image processing unit. The system includes a unit to receive an image, a transmission queue and a buffer to store the image, an image processing unit to determine whether the image includes a defect image, a unit that generates defect information when the presence of a defect image is determined, an image extraction unit that extracts the defect image based on the defect information, and a storage unit for storing such defect image.