The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2014

Filed:

Feb. 15, 2005
Applicants:

Fokko Pieter Wieringa, Elst, NL;

Dirkjan Bakker, Alphen aan den Rijn, NL;

Antonius Franciscus Wilhelmus Van Der Steen, Rotterdam, NL;

Frits Mastik, Rotterdam, NL;

Rene Gerardus Maria Van Melick, Marken, NL;

Inventors:

Fokko Pieter Wieringa, Elst, NL;

Dirkjan Bakker, Alphen aan den Rijn, NL;

Antonius Franciscus Wilhelmus van der Steen, Rotterdam, NL;

Frits Mastik, Rotterdam, NL;

Rene Gerardus Maria van Melick, Marken, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of obtaining an image of buried structures in an object, comprising: providing a camera for imaging visual and infrared-images; providing a bounded light source; partly irradiating said object by said bounded light source; imaging a non-irradiated area of said object by said camera to image said buried structure; and combining said buried structure image with a visual image of said object. Accordingly an image can be obtained while discarding specular reflections of the object. Additionally there is disclosed a method of enhancing imaging of buried structures in an object, comprising: aligning said infrared light source with a visual light source; providing a first edge analysis of said infrared image; providing a second edge analysis of said visual image; comparing said first and second edge analysis; and discarding edges in said infrared image that are also detected in said second image.


Find Patent Forward Citations

Loading…