The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2014
Filed:
Aug. 02, 2012
Gregg D. Sucha, Manchester, MI (US);
Martin E. Fermann, Dexter, MI (US);
Donald J. Harter, Ann Arbor, MI (US);
Gregg D. Sucha, Manchester, MI (US);
Martin E. Fermann, Dexter, MI (US);
Donald J. Harter, Ann Arbor, MI (US);
Imra America, Inc., Ann Arbor, MI (US);
Abstract
Methods and apparatuses for performing temporal scanning using ultra-short pulse width lasers in which only minimal (micro-scale) mechanical movement is required, and related methods for obtaining high-accuracy timing calibration, on the order of femtoseconds, are disclosed. A dual laser system is disclosed in which the cavity of one or more of the lasers is dithered using a piezoelectric element. A Fabry-Perot etalon generates a sequence of timing pulses used in conjunction with a laser beam produced by the laser having the dithered laser cavity. A correlator correlates a laser pulse from one of the lasers with the sequence of timing pulses to produce a calibrated time scale. The invention is applicable to applications requiring rapid scanning and time calibration, including metrology, characterization of charge dynamics in semiconductors, electro-optic testing of ultrafast electronic and optoelectronic devices, optical time domain reflectometry, and electro-optic sampling oscilloscopes.