The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2014
Filed:
Feb. 15, 2011
Yi He, Fremont, CA (US);
Larry Wang, San Jose, CA (US);
Sean Lynch, Ben Lomond, CA (US);
Che-ping Chen, Sunnyvale, CA (US);
Wei Zhao, Fremont, CA (US);
Albert Bergemont, Palo Alto, CA (US);
Yi He, Fremont, CA (US);
Larry Wang, San Jose, CA (US);
Sean Lynch, Ben Lomond, CA (US);
Che-Ping Chen, Sunnyvale, CA (US);
Wei Zhao, Fremont, CA (US);
Albert Bergemont, Palo Alto, CA (US);
Maxim Integrated Products, Inc., San Jose, CA (US);
Abstract
A dynamic trim method includes testing a selected number of cells on a die with predetermined testing margins. Data from this testing is used to determine dynamic reference margins for improving yield. Advantageously, yield is improved by allowing functioning fast or slow units to pass wafer sort by applying the dynamic reference margins for varying processes.