The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2014
Filed:
Jun. 02, 2010
Yasuyuki Ozeki, Osaka, JP;
Kazuyoshi Itoh, Osaka, JP;
Fumihiro Dake, Osaka, JP;
Kiichi Fukui, Osaka, JP;
Shinichiro Kajiyama, Osaka, JP;
Yuma Kitagawa, Osaka, JP;
Norihiko Nishizawa, Osaka, JP;
Kazuhiko Sumimura, Osaka, JP;
Yasuyuki Ozeki, Osaka, JP;
Kazuyoshi Itoh, Osaka, JP;
Fumihiro Dake, Osaka, JP;
Kiichi Fukui, Osaka, JP;
Shinichiro Kajiyama, Osaka, JP;
Yuma Kitagawa, Osaka, JP;
Norihiko Nishizawa, Osaka, JP;
Kazuhiko Sumimura, Osaka, JP;
Canon Kabushiki Kaisha, , JP;
Abstract
The invention provides an optical microscope that prevents an increase in the complexity of the light source system and is equipped with optics readily capable of adequate operation even when the modulation frequency is increased in order to reduce the impact of the intensity noise of the laser, etc. This optical microscopeirradiates a samplewith a first train of optical pulses having a first optical frequency, which is generated by a first light source, and a second train of optical pulses having a second optical frequency, which is temporally synchronized with the first train of optical pulses and is generated by a second light source, and detects light scattered from the sample. The repetition frequency of the train of optical pulses generated by the first light source is an integral sub-multiple of the repetition frequency of the train of optical pulses generated by the second light source.