The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2014
Filed:
Jul. 22, 2013
International Business Machines Corporation, Armonk, NY (US);
Mark A. Ferriss, Tarrytown, NY (US);
Arun Natarajan, White Plains, NY (US);
Benjamin Parker, Peekskill, NY (US);
Alexander Rylyakov, Mount Kisco, NY (US);
Jose A. Tierno, Palo Alto, CA (US);
Soner Yaldiz, Pittsburgh, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for compensating for offsets when measuring parameters of a phase-locked loop (PLL). In one embodiment, a proportional path in the PLL is temporarily shut off, a measurement is made of a real time-to-zero crossing in the PLL to measure a defined parameter of the PLL, the proportional path is switched on, and the defined loop parameter is adjusted based on this measurement. In one embodiment, the real time-to-zero crossing is measured after introducing a phase step into the PLL between a reference signal and an output signal of the PLL. In an embodiment, two phase steps, having opposite polarities, are successively introduced into the PLL, and the time-to-crossing measurements resulting from these two phase steps may be averaged, and this average is used to determine a loop parameter.