The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2014

Filed:

Sep. 11, 2012
Applicants:

Chin-fu Chang, Taipei, TW;

Guang-huei Lin, Taipei, TW;

Inventors:

Chin-Fu Chang, Taipei, TW;

Guang-Huei Lin, Taipei, TW;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 27/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention discloses a multi-stage sample and hold (S/H) circuit that includes: a first S/H circuit for sampling a sensing signal of a sensor multiple times and accumulating them into a first sampled signal, and outputting the first sampled signal; and a second S/H circuit for receiving the plurality of first sampled signals and accumulating them into a second sampled signal. As a result, when one or more first sampled signals are saturated due to instantaneous noise, the second sampled signal is not saturated, thereby increasing the noise tolerance of the multi-stage S/H circuit.


Find Patent Forward Citations

Chang, Chin-Fu. (2014). Multi-stage sample and hold circuit (U.S. Patent No. 8629695). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8629695

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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