The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2014

Filed:

Aug. 09, 2007
Applicants:

Horst Scherer, Unterhaching, DE;

Thomas Hartmann, Uffing am Staffelsee, DE;

Stephan Mair, Weilheim, DE;

Heinz-josef Romanski, Rotenburg a. d. Fulda, DE;

Inventors:

Horst Scherer, Unterhaching, DE;

Thomas Hartmann, Uffing am Staffelsee, DE;

Stephan Mair, Weilheim, DE;

Heinz-Josef Romanski, Rotenburg a. d. Fulda, DE;

Assignee:

Agfa HealthCare NV, Mortsel, BE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/004 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and to a corresponding apparatus reads out X-ray information stored in a storage phosphor plate (), the storage phosphor plate () being irradiated with stimulation light () and so being stimulated into emitting emission light which is collected by a detector () during several measuring times and being converted into corresponding emission light signals (S, R). In order to guarantee high reliability when examining sensitivity fluctuations, in particular with different types of detectors, provision is made such that reference measurements are taken by the detector () during several reference measuring times and several reference signals are thus produced, the individual reference measuring times falling respectively between the measuring times, and the reference signals being used for examining the sensitivity of the detector () to emission light.


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