The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2014
Filed:
Aug. 06, 2010
Richard R. Wilson, Arden Hills, MN (US);
Douglas R. Oudekerk, Saint Paul, MN (US);
Douglas P. Wilson, Madison, WI (US);
Karla M. Fogel, Evanston, IL (US);
Rebecca Neth Townsend, Bellevue, WA (US);
Richard R. Wilson, Arden Hills, MN (US);
Douglas R. Oudekerk, Saint Paul, MN (US);
Douglas P. Wilson, Madison, WI (US);
Karla M. Fogel, Evanston, IL (US);
Rebecca Neth Townsend, Bellevue, WA (US);
Covenant Ministries of Benevolence Inc., Chicago, IL (US);
Other;
Abstract
Systems and methods for analyzing the gait of an individual are disclosed. The disclosed systems and methods can be configured to acquire data from a first array and a second array of sensors that are configured to be placed in a left and/or right shoe, respectively. The acquired data can be collected or separated into at least two separate gait phases for each array, compared to a baseline condition for each gait phase and categorized into one of at least two uniformity categories for each gait phase. Examples of collected and/or calculated data include pressure values, shear stress values and torque values. The analysis can be focused on both feet of a person, or focused on one foot. A graphical output showing at least one entire gait cycle based on the uniformity categories can then be generated.