The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2014
Filed:
Aug. 02, 2012
Applicants:
Sunjae Lee, Yongin-si, KR;
Jungyoon Hwang, Yongin-si, KR;
Junghee Kim, Soengnam-si, KR;
Inventors:
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test map classification method includes modifying test data by converting to a test map including a wafer identifier, a coordinate, and data on whether a predetermined failure item occurs; calculating similarities of wafer pairs in the test map; performing similarity filtering to reset all the similarities, except for at least one similarity, on the basis of a predetermined wafer; determining whether there are similar wafers by comparing the filtered similarities with a reference value; and classifying spatial patterns using a similar relationship between the wafer pairs when there are similar wafers.