The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2014

Filed:

Aug. 02, 2004
Applicant:

Steven P. Kim, Raleigh, NC (US);

Inventor:

Steven P. Kim, Raleigh, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/048 (2013.01); G06F 15/177 (2006.01);
U.S. Cl.
CPC ...
Abstract

Enabling users to select a subset of elements represented by a rendered topology view, and in response, a new view comprising the selected elements is automatically created. Preferred embodiments render this subset view, referred to herein as a 'tear-away view', alongside the topology view from which the elements were selected, thereby enabling the user to focus on the selected elements in context of the bigger picture. An active correlation is preferably maintained between the views, such that various updates to one view are also reflected in the other view. Preferred embodiments automatically create a new data model underlying the tear-away view, and in one aspect, this data model and/or tear-away view may be persisted.


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