The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2014

Filed:

Nov. 11, 2010
Applicants:

Paul F. Policke, Austin, TX (US);

Kim S. Hong, Austin, TX (US);

Paul Douglas Bassett, Austin, TX (US);

Inventors:

Paul F. Policke, Austin, TX (US);

Kim S. Hong, Austin, TX (US);

Paul Douglas Bassett, Austin, TX (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A feedback scan isolation and bypass architecture apparatus and method. The apparatus includes core logic, and input and output multiplexers. The input multiplexer selectively provides a functional input or the core output to the core input based on a test signal. The output multiplexer selectively provides the core output or the input multiplexer output to a functional output based on the test signal. When the test signal indicates core feedback testing, the output multiplexer outputs the core output and the input multiplexer feeds back the core output to the core input. When the test signal indicates bypass testing, the input multiplexer outputs the functional input and the output multiplexer outputs the functional input bypassing the core logic. Logic can block the feedback or bypass signals when there are timing issues. Logic can modify the number of feedback or bypass signals when the number of functional inputs and outputs are different.


Find Patent Forward Citations

Policke, Paul. (2014). Feedback scan isolation and scan bypass architecture (U.S. Patent No. 8627159). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8627159

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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