The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2014
Filed:
Sep. 25, 2009
Francesco Lanza Di Scalea, San Diego, CA (US);
Stefano Coccia, Los Angeles, CA (US);
Ivan Bartoli, Philadelphia, PA (US);
Salvatore Salamone, Buffalo, NY (US);
Piervincenzo Rizzo, Pittsburgh, PA (US);
Francesco Lanza Di Scalea, San Diego, CA (US);
Stefano Coccia, Los Angeles, CA (US);
Ivan Bartoli, Philadelphia, PA (US);
Salvatore Salamone, Buffalo, NY (US);
Piervincenzo Rizzo, Pittsburgh, PA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
Disclosed are systems, methods and articles, including an inspection system that includes at least one generator to apply energy to an object at an application point to cause waves to travel, at least partly, through the object. The system further includes at least one detector configured to detect at least a portion of the waves traveling through the object, and a statistical analyzer to perform a statistical analysis based on an output produced by the at least one detector in response to the detected portion of the waves, the statistical analysis being used to determine whether at least one defect is present in the object.