The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2014
Filed:
Sep. 27, 2006
Ronald A. Skoog, Shrewsbury, NJ (US);
Thomas Clyde Banwell, Howell, NJ (US);
Haim Kobrinski, Colts Neck, NJ (US);
Sarry Habiby, Middletown, NJ (US);
Joel W. Gannett, Atlantic Highlands, NJ (US);
Russell Fischer, Bernardsville, NJ (US);
Ronald A. Skoog, Shrewsbury, NJ (US);
Thomas Clyde Banwell, Howell, NJ (US);
Haim Kobrinski, Colts Neck, NJ (US);
Sarry Habiby, Middletown, NJ (US);
Joel W. Gannett, Atlantic Highlands, NJ (US);
Russell Fischer, Bernardsville, NJ (US);
TTI Inventions A LLC, Wilmington, DE (US);
Abstract
A method and system to economically monitor an optical OOK signal that can detect perceptible changes in signal quality and identify the type of optical impairment causing the change. The invention requires a new and novel combination of known techniques to create an eye diagram of the transmitted pulse in a wavelength division multiplexing systems and then removing the noise from the eye diagram. Economy of operation is achieve by using asynchronous sampling techniques for generating the eye diagram. The resulting 'cleaner' eye diagram is then analyzed to identify any changes in performance. In the preferred embodiment, the analysis is conducted on histograms generated from eye diagram, the histograms are computed at a number of points across the optical signal pulse period.