The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2014

Filed:

Jun. 14, 2011
Applicants:

Kazuhiko Sakamoto, Chino, JP;

Hiroshi Kawakita, Chino, JP;

Hiroyuki Okami, Chino, JP;

Yusuke Iso, Chino, JP;

Ryuta Okamoto, Tokyo, JP;

Inventors:

Kazuhiko Sakamoto, Chino, JP;

Hiroshi Kawakita, Chino, JP;

Hiroyuki Okami, Chino, JP;

Yusuke Iso, Chino, JP;

Ryuta Okamoto, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/61 (2006.01);
U.S. Cl.
CPC ...
Abstract

A particle concentration measuring device includes: a measurement region formation part which has a wall () of substantially ring-form and through an inner opening of which gas relatively flows orthogonally; a light curtain forming unit (A,B) forming a planar light curtain (FL) in the inner opening: a particle detecting unit () receiving scattered light from particles passing through the light curtain (FL) to detect the particles; and a calculating unit () calculating particle concentration based on the total number of the particles detected by the particle detecting unit () in a volume of an airflow passing through the light curtain (FL) in a unit time.


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