The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2014
Filed:
Jun. 20, 2011
Chung-jen Wang, New Taipei, TW;
Li-sheng Shu, Shenzhen, TW;
Bi-qing Luo, Shenzhen, CN;
Tsung-jen Chuang, New Taipei, TW;
Shih-fang Wong, New Taipei, TW;
Chung-Jen Wang, New Taipei, TW;
Li-Sheng Shu, Shenzhen, TW;
Bi-Qing Luo, Shenzhen, CN;
Tsung-Jen Chuang, New Taipei, TW;
Shih-Fang Wong, New Taipei, TW;
Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Abstract
A method for measuring size of an object is provided. The method includes controlling a distance measurement unit to measure a vertical distance between an electronic device and the object in response to a measurement operation, controlling an image capturing unit to capture an image in front of the electronic device, which includes an image of the object in response to the measurement operation. Computing an actual size of the captured area according to the distance measured by the distance measurement unit and an angle of view of the image capturing unit. In addition, obtaining the image of the object from the captured image, and further computing the proportion of the image of the object in the captured image. Then computing the size of the object according to the proportion and the actual size of the captured area, and displaying the measured size of the object.