The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2014
Filed:
Jun. 20, 2011
Mao-sheng Huang, Tu-Cheng, TW;
Chuang Yue, Shenzhen, CN;
Mao-Sheng Huang, Tu-Cheng, TW;
Chuang Yue, Shenzhen, CN;
Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Abstract
A test probe for testing an object electrically includes a main body, a first probe pin mounted to and protruding out of the main body, and at least one second probe pin coupled to the main body. The at least one second probe pin is changeable from a first state of being folded into the main body to a second state of being unfolded to protrude out of the main body. When the at least one second probe pin is in the first state, the first probe pin is used to contact the object, and when the at least one second probe pin is in the second state, the at least one second probe pin takes the place of the first probe pin in making electrical connection with the object.