The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2014

Filed:

Jan. 06, 2010
Applicants:

Isamu Seto, Utsunomiya, JP;

Yoshio Suzaki, Utsunomiya, JP;

Masamichi Kuwabara, Utsunomiya, JP;

Inventors:

Isamu Seto, Utsunomiya, JP;

Yoshio Suzaki, Utsunomiya, JP;

Masamichi Kuwabara, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/147 (2006.01); G21K 5/04 (2006.01); G21K 1/08 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A charged particle beam writing apparatus includes an aperture array configured to be capable of forming a plurality of charged particle beams using a plurality of openings, an element array including a plurality of main elements and a plurality of auxiliary elements different from the main elements, and a control unit configured to acquire information associated with a defect of the plurality of main elements and control the element array in accordance with the information, wherein the control unit controls the element array such that only the main elements are used when there is no defect, while when there is a main element having a defect, an auxiliary element is used without using the main element having the defect.


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