The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2014
Filed:
Jun. 16, 2009
David Campion, Agoura Hills, CA (US);
David M. Kane, Tuscon, AZ (US);
Nicholas Dwork, Santa Clarita, CA (US);
Matthew Pohlman, Moorpark, CA (US);
Randall Potter, Northridge, CA (US);
David Campion, Agoura Hills, CA (US);
David M. Kane, Tuscon, AZ (US);
Nicholas Dwork, Santa Clarita, CA (US);
Matthew Pohlman, Moorpark, CA (US);
Randall Potter, Northridge, CA (US);
Other;
Abstract
Selected scene regions are imaged. I: mirrors (preferably MEMS) address an imaging sensor to regions. C: the mirrors direct radiation from a source to a calibration sensor, along an imaging-channel segment. Beam splitter(s) let the channels share optical path at the mirrors. To minimize imaging-channel diffractive blur, the calibration channel modifies wavefront angle and smoothness at the mirrors—measuring (and setting mirrors to optimize) PSF sharpness, then applying these measurements (and settings) to optimize imaging-channel settings by iterative multidimensional gradient search. An afocal lens receives scene radiation, magnifying deflection at the scene. An FOR is imaged on the imaging sensor; the mirrors address the sensor to a narrow FOV within the FOR; the lens enlarges deflections to cover the FOR. Plural diffraction-grating orders communicate between calibration source and sensor when the selected region is in plural scene portions, regardless which FOV is addressed.