The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2014

Filed:

Nov. 17, 2011
Applicants:

Cheng-en Guo, Santa Clara, CA (US);

Ben Jang, Cupertino, CA (US);

Wenjing LI, Fremont, CA (US);

Inventors:

Cheng-en Guo, Santa Clara, CA (US);

Ben Jang, Cupertino, CA (US);

Wenjing Li, Fremont, CA (US);

Assignee:

Optovue, Inc., Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

System and method for 3D retinal disruption/elevation detection, measurement and presentation using Optical Coherence Tomography (OCT) are provided. The present invention is capable of detecting and measuring the abnormal changes of retinal layers (retinal disruptions), caused by retinal diseases, such as hard drusen, soft drusen, Pigment Epithelium Detachment (PED), Choroidal Neovascularization (CNV), Geographic Atrophy (GA), intra retinal fluid space, and exudates etc. The presentations of the results are provided with quantitative measurements of disruptions in retina and can be used for diagnosis and treatment of retinal diseases.


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