The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2014

Filed:

Jun. 08, 2011
Applicants:

Stephen W. Farrer, Albuquerque, NM (US);

Thomas D. Raymond, Edgewood, NM (US);

Wei Xiong, Albuquerque, NM (US);

John Dixson, Albuquerque, NM (US);

Daniel R. Neal, Tijeras, NM (US);

Inventors:

Stephen W. Farrer, Albuquerque, NM (US);

Thomas D. Raymond, Edgewood, NM (US);

Wei Xiong, Albuquerque, NM (US);

John Dixson, Albuquerque, NM (US);

Daniel R. Neal, Tijeras, NM (US);

Assignee:

AMO Wavefront Sciences, LLC, Santa Ana, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An algorithm locates valid light spots produced on an image detector by a wavefront of interest. The algorithm includes sequentially examining pixels of the image detector to determine for each of the pixels whether the light intensity detected by the pixel is greater than a threshold, When the pixel's detected light intensity is determined to be greater than the threshold, the algorithm includes: determining whether the pixel belongs to a valid light spot; and when the pixel is determined to belong to a valid light spot; saving data indicating a location for the valid light spot; and masking out a group of pixels of the image detector at the determined location such that the masked pixels are considered to have a light intensity less than the threshold for a remainder of the sequential examination.


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