The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2013

Filed:

Jan. 10, 2011
Applicants:

Seung Hoon Nahm, Daejeon, KR;

Hoon Sik Jang, Daegu, KR;

Sang Gu Jeon, Busan, KR;

Min Seok Kim, Daejeon, KR;

Inventors:

Seung Hoon Nahm, Daejeon, KR;

Hoon Sik Jang, Daegu, KR;

Sang Gu Jeon, Busan, KR;

Min Seok Kim, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01); B81B 7/02 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is an electrical-mechanical complex sensor for nanomaterials, including: a detector having a piezoelectric film therein, for measuring a mechanical property of a nanomaterial when a bending or tensile load is applied to the nanomaterial; a first detection film formed at an end of the detector to measure the mechanical property and an electrical property of the nanomaterial) in real time at the same time, when the nanomaterial contacts the first detection film; and a support to which one end of the detector is integrally connected, for supporting the detector.


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