The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2013

Filed:

Sep. 12, 2011
Applicants:

Fadi Micaelian, Menlo Park, CA (US);

Matt Huey, Santa Clara, CA (US);

Richard Schank, Oakland, CA (US);

Sanjay Prasad, Los Altos, CA (US);

Gregory D. Gorder, Seattle, WA (US);

Inventors:

Fadi Micaelian, Menlo Park, CA (US);

Matt Huey, Santa Clara, CA (US);

Richard Schank, Oakland, CA (US);

Sanjay Prasad, Los Altos, CA (US);

Gregory D. Gorder, Seattle, WA (US);

Assignee:

IVP Holdings III LLC, Bellevue, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 40/00 (2012.01);
U.S. Cl.
CPC ...
Abstract

Methods, systems, and techniques for estimating patent infringement risk for a company using a statistical model of revenue are provided. Examples also provide a Patent Infringement Risk Assessment Tool, which uses these techniques to enable users to dynamically modify certain parameters and obtain a feel for their affect upon patent infringement risk exposure. Other examples describe the applicability of some of the methods and techniques for describing models of overall behavior when only the behavior of a segment at either the low end or high end (a tail) is known.


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