The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2013
Filed:
Jul. 24, 2007
Biao Yu, Ayer, MA (US);
Matthew Englehart, Olmsted Township, OH (US);
Biao Yu, Ayer, MA (US);
Matthew Englehart, Olmsted Township, OH (US);
The MathWorks, Inc., Natick, MA (US);
Abstract
Programming or modeling environments in which programs or models are simulated or executed with tunable sample times are disclosed. The tunable sample times can be changed during the simulation or execution of the programs or models without recompiling the programs or models. The sample times are parameterized and the value of the sample times is changed during the simulation or execution of the programs or models. The sample times may be changed manually by a user. Alternatively, the sample times may be automatically changed by programmatically defining when and how the sample times are determined.