The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2013
Filed:
Oct. 05, 2009
Bernhard B. Sterling, Danville, CA (US);
W. Dale Hall, Oakland, CA (US);
Kenneth G. Witte, San Jose, CA (US);
Mark Wechsler, San Mateo, CA (US);
Peng Zheng, Alameda, CA (US);
Richard Keenan, Livermore, CA (US);
Bernhard B. Sterling, Danville, CA (US);
W. Dale Hall, Oakland, CA (US);
Kenneth G. Witte, San Jose, CA (US);
Mark Wechsler, San Mateo, CA (US);
Peng Zheng, Alameda, CA (US);
Richard Keenan, Livermore, CA (US);
OptiScan Biomedical Corporation, Hayward, CA (US);
Abstract
A method and apparatus are described that permit an analyte concentration to be estimated from a measurement in the presence of compounds that interfere with the measurement. The method reduces the error in the analyte concentration in the presence of interferents. The method includes the use of a set of measurements obtained for a large population having a range of known analyte and interfering compound concentrations. From a sample measurement, which may or may not be one of the population, likely present interferents are identified, and a calibration vector is calculated.