The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2013

Filed:

Dec. 22, 2009
Applicants:

Thommen Korah, Marina Del Rey, CA (US);

Swarup S. Medasani, Thousand Oaks, CA (US);

Yuri Owechko, Newbury Park, CA (US);

Inventors:

Thommen Korah, Marina Del Rey, CA (US);

Swarup S. Medasani, Thousand Oaks, CA (US);

Yuri Owechko, Newbury Park, CA (US);

Assignee:

HRL Laboratories, LLC, Malibu, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of recognizing features in a 3D environment includes using a sensor that collects a plurality of sensed data points, populating a strip histogram grid having a plurality of strips, each strip having a dx dimension and a dy dimension, by assigning each sensed data point to a strip in the strip histogram grid that has x, y and z dimensions that encompass the spatial coordinate information of the respective assigned sensed data point, and estimating the local ground plane for a strip in the strip histogram grid by using information on each sensed data point assigned to that strip and surrounding strips in the strip histogram grid. Further methods include extracting smooth surfaces, building segmentation, top down segmentation and bottom up segmentation.


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