The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2013
Filed:
Feb. 24, 2010
Masahiro Takayama, Kitakushu, JP;
Daisuke Mitani, Ayabe, JP;
Masahiro Takayama, Kitakushu, JP;
Daisuke Mitani, Ayabe, JP;
Omron Corporation, Kyoto, JP;
Abstract
The present invention provides a model image acquisition support apparatus, a model image acquisition support method, and a model image acquisition support program that can easily and swiftly obtain an optimum model image for an image processing apparatus that performs matching processing based on a model image set in advance with respect to a measurement image that is obtained by imaging an object. A plurality of model image candidates, serving as candidates for model image, are extracted from a reference image obtained by imaging an object which can be a model. Matching processing with the plurality of extracted model images is executed on measurement images actually obtained by a visual sensor, so that trial results are obtained. A trial result is generated upon evaluating each of the trial results of the matching processing with the model image. An optimum model image is determined based on the evaluation result.