The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2013

Filed:

Nov. 04, 2010
Applicants:

Christian J. Michel, Lenoir City, TN (US);

Johan Nuyts, Heverlee, BE;

Inventors:

Christian J. Michel, Lenoir City, TN (US);

Johan Nuyts, Heverlee, BE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is a method of generating a best estimate of an image attenuation map derived from a truncated image attenuation map and PET emissions data for the object being imaged by a morphological imaging modality. The method involves a plurality of steps beginning with the recordation and processing of PET emissions data. Next, the morphological imaging modality records image data which is processed to determine an attenuation map. The attenuation map, for image modalities such as CT and MR scanning systems integrated with PET, is truncated, resulting in a truncated attenuation map image. Pixels for which attenuation data needs to be determined are identified and attenuation coefficients for these pixels are estimated and combined with the truncated attenuation map to generate a full initial attenuation map for the image, which is iteratively processed together with the PET emission data until the improvement change in the emission image reaches a defined threshold improvement level.


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