The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2013
Filed:
May. 03, 2010
Frank Dennerlein, Forchheim, DE;
Stefan Hoppe, Amberg, DE;
Markus Kowarschik, Langenzenn, DE;
Holger Scherl, Erlangen, DE;
Frank Dennerlein, Forchheim, DE;
Stefan Hoppe, Amberg, DE;
Markus Kowarschik, Langenzenn, DE;
Holger Scherl, Erlangen, DE;
Siemens Aktiengesellschaft, München, DE;
Abstract
A method and a device for determining attenuation coefficients for an object using a movable X-ray source and a detector, which is provided for recording projections, is provided. The method includes specifying a trajectory for the movable X-ray source, specifying positions on the trajectory for determining a derivative of projections recorded by the detector, specifying a plurality of scanning positions for each of the specified positions, following the trajectory with the X-ray source and recording a projection for each scanning position, numerically calculating a projection derivative in relation to the trajectory path for each of the positions using the projections recorded for the associated plurality of scanning positions, and determining attenuation coefficients for the object from the calculated projection derivatives using a theoretically exact or approximate rule for the reconstruction.