The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2013

Filed:

Apr. 18, 2012
Applicants:

Jong EE OH, Daejeon, KR;

Hun Sik Kang, Daejeon, KR;

Jung BO Son, Daejeon, KR;

Sok Kyu Lee, Daejeon, KR;

Inventors:

Jong Ee Oh, Daejeon, KR;

Hun Sik Kang, Daejeon, KR;

Jung Bo Son, Daejeon, KR;

Sok Kyu Lee, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus of selecting N metrics among M metrics is provided. The apparatus determines M metrics P(i), where i=1, . . . , M. Each P(i) is represented by B bits. The apparatus determines N metrics among M metrics. The complexity for configuring the circuit is decreased, and the length of the critical path is reduced.


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Oh, Jong. (2013). Method of selecting metrics and receiver using the same (U.S. Patent No. 8619913). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8619913

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