The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2013

Filed:

Nov. 17, 2010
Applicants:

William D. Dallas, Merrimack, NH (US);

Chris Busick, Shrewsbury, MA (US);

Inventors:

William D. Dallas, Merrimack, NH (US);

Chris Busick, Shrewsbury, MA (US);

Assignee:

Netapp, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G08C 15/00 (2006.01); H04L 1/00 (2006.01); G06F 11/00 (2006.01); G06F 15/173 (2006.01); G06F 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and system for handling error events on a current path for processing an I/O request for reading information from and writing information to a storage space is provided. A system is able to communicate with the storage space via more than one path. If the current path reports an error event, then an alternate path quality is determined to ascertain whether the alternate path will generate an error similar to the current path. The alternate path quality is determined based on a plurality of factors which are assigned certain weights. The weights are determined based on a likely contribution of each factor to a repetition of the error reported by the current path. If the alternate path quality is equal to or exceeds a programmable threshold value, then the alternate path is selected.


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