The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2013

Filed:

Mar. 22, 2012
Applicants:

San Yuan Liew, Singapore, SG;

Suttisak Nilchim, Takuapa, TH;

Petrus HU, Petaling Jaya, MY;

Theivarayan Prakash Somasundaram, Kelana Jaya, MY;

Inventors:

San Yuan Liew, Singapore, SG;

Suttisak Nilchim, Takuapa, TH;

Petrus Hu, Petaling Jaya, MY;

Theivarayan Prakash Somasundaram, Kelana Jaya, MY;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A disk drive configured to enable media defect margining during disk testing may comprise a disk comprising a plurality of tracks; a head actuated over the disk; and a processor operable to test media of the disk drive to detect a media defect; estimate a depth of the detected media defect; determine a margining amount based on at least the estimated depth of the detected media defect, and apply the determined margining amount to the detected media defect.


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