The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2013
Filed:
Jan. 26, 2011
Sheng Xu, Katy, TX (US);
Yu Zhang, Katy, TX (US);
Bing Tang, Katy, TX (US);
Cggveritas Services (U.S.) Inc., Houston, TX (US);
Abstract
A method for calculating angle domain common image gathers (ADCIGs). The method includes calculating a source wavefield pof a seismic source; calculating a receiver wavefield pof a seismic receiver; applying an algorithm of anti-leakage Fourier transform (ALFT) to transform the source wavefield pto a wavenumber domain; applying the ALFT algorithm to the receiver wavefield to transform the receiver wavefield in the wavenumber domain; determining an imaging condition to the ALFT source and receiver wavefields in the wavenumber domain; computing a reflection angle θ and an azimuth angle φ of the source wavefield pand receiver wavefield pin the wavenumber domain; calculating the ADCIGs in the wavenumber domain; and applying an inverse fast Fourier transform (FFT) to determine the ADCIGs in the space domain.