The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2013

Filed:

Sep. 30, 2009
Applicants:

Yi Ding, Saratoga, CA (US);

Lifen Tian, Sunnyvale, CA (US);

Hitoshi Sekine, Los Altos, CA (US);

Inventors:

Yi Ding, Saratoga, CA (US);

Lifen Tian, Sunnyvale, CA (US);

Hitoshi Sekine, Los Altos, CA (US);

Assignee:

Ricoh Company, Ltd, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are disclosed for enabling legacy devices to consistently and reliably operate within a distributed scan environment using proxy scan services. A proxy scan service is communicatively coupled between a scan management service and a scanner. Information transmitted between the scan management service and the scanner is intercepted at the proxy scan service, where the scan management service recognizes a first format message for the information and the scanner recognizes a second format message for the information. The information is converted at the proxy scan service between the first format message and the second format message. The transmission between the scan management service and the scanner is completed using the converted information.


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