The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2013

Filed:

Jun. 21, 2011
Applicants:

Calvin L Powell, Merritt Island, FL (US);

Kevin F Williams, Orlando, FL (US);

Michael C Snead, Oviedo, FL (US);

Inventors:

Calvin L Powell, Merritt Island, FL (US);

Kevin F Williams, Orlando, FL (US);

Michael C Snead, Oviedo, FL (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01); H04N 5/335 (2011.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for reconstructing pixel values at bad (i.e. fully or partially defective, saturated, and/or non-responsive in one or more spectral bands) pixel locations in multi-spectral photo-detectors are provided herein. A detector having pixel locations responsive in two or more spectral bands may have pixel values at bad pixel locations reconstructed from adjacent pixel location band ratios so long as the bad pixel location is operational/responsive in at least one spectral band. Pixel locations may be two (or more) color pixels, stacked FPAs, 'virtual' locations created by mapping pixels in a first detector to pixels in a second detector, or 'super pixels' defined on a detector with a patterned band-pass filter.


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