The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2013
Filed:
Apr. 16, 2010
Atsushi Ikeda, Kawasaki, JP;
Wataru Suzuki, Kawasaki, JP;
Atsushi Ikeda, Kawasaki, JP;
Wataru Suzuki, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A deformation information transformation OK/NG discrimination unit determines whether or not it is possible to achieve a transformation equivalent to three-dimensional deformation information by only two-dimensional affine transformation. If it is possible to achieve this transformation, a two-dimensional bitmap generation unit generates a processed two-dimensional graphics image by applying the two-dimensional affine transformation equivalent to the transformation indicated by the three-dimensional deformation information to a two-dimensional graphics image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile