The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2013

Filed:

Sep. 29, 2006
Applicants:

Joern Ehrenberg, Traunstein, DE;

Herman Meyer, Schneizlreuth, DE;

Erich Strasser, Trostberg, DE;

Inventors:

Joern Ehrenberg, Traunstein, DE;

Herman Meyer, Schneizlreuth, DE;

Erich Strasser, Trostberg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/34 (2006.01); G06M 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A position-measuring device for measuring linear and/or angular positions includes a first measuring standard that has a first code track, with the aid of which consecutive position regions are cyclically measurable, and at least two multiturn code disks having second code tracks, via whose angular positions the currently measured position region of the first code track may be determined. The first measuring standard and the multiturn code disks are positioned such that the first code track and the second code tracks are scannable by a common scanning unit, through a first scanning window and second scanning windows, respectively.


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