The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2013

Filed:

Jun. 22, 2011
Applicants:

Jung-hoon Kim, Asan-si, KR;

Yong-hyun Kim, Yongin-si, KR;

Seong-chan Han, Cheonan-si, KR;

Kwang-su Yu, Cheonan-si, KR;

Jae-seon Hwang, Asan-si, KR;

Inventors:

Jung-Hoon Kim, Asan-si, KR;

Yong-Hyun Kim, Yongin-si, KR;

Seong-Chan Han, Cheonan-si, KR;

Kwang-Su Yu, Cheonan-si, KR;

Jae-Seon Hwang, Asan-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-Si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01R 13/15 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test socket may include a socket frame, a plate, a socket pin and a link. The socket frame may have a slot configured to accept an object. The plate may be free to move in the slot along an inserting direction of the object to support a lower surface of the object. The socket pin may be movably arranged in a direction substantially perpendicular to the inserting direction of the object. The socket pin may selectively make contact with a tab of the object. A link may be pivotally connected to the socket pin and the plate. Thus, the socket pin of the test socket may avoid dragging along the tab of the object during insertion, and accordingly, the tab of the object may avoid damage.


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