The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2013

Filed:

Aug. 05, 2009
Applicants:

Joseph Parkos, East Haddam, CT (US);

Daniel A. Bales, Avon, CT (US);

Mimi Nguyen-vu, Berlin, CT (US);

Gary M. Lomasney, Glastonbury, CT (US);

Philip H. Ratliff, Cheshire, CT (US);

Inventors:

Joseph Parkos, East Haddam, CT (US);

Daniel A. Bales, Avon, CT (US);

Mimi Nguyen-Vu, Berlin, CT (US);

Gary M. Lomasney, Glastonbury, CT (US);

Philip H. Ratliff, Cheshire, CT (US);

Assignee:

United Technologies Corporation, Hartford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

A non-destructive inspection method for detecting the presence of a contaminant that has alloyed with a metallic alloy of a part includes exposing the metallic alloy of the part to an extraction solution. The extraction solution extracts at least a portion of any of the contaminant that has alloyed with the metallic alloy. The extraction solution can then be analyzed to determine whether the solution includes any of the contaminant element, which indicates whether the part includes any of the contaminant element.


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