The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2013

Filed:

Nov. 16, 2010
Applicants:

Venkat Rajeev Indukuru, Austin, TX (US);

Daniel Owen, Manchester, GB;

Alexander Erik Mericas, Austin, TX (US);

John Fred Spannaus, Austin, TX (US);

Inventors:

Venkat Rajeev Indukuru, Austin, TX (US);

Daniel Owen, Manchester, GB;

Alexander Erik Mericas, Austin, TX (US);

John Fred Spannaus, Austin, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A processor performance profiler is enabled to for identify specific instructions causing performance issues within a program being executed by a microprocessor through random sampling to find the worst-case offenders of a particular event type such as a cache miss or a branch mis-prediction. Tracking all instructions causing a particular event generates large data logs, creates performance penalties, and makes code analysis more difficult. However, by identifying and tracking the worst offenders within a random sample of events without having to hash all events results in smaller memory requirements for the performance profiler, lower performance impact while profiling, and decreased complexity to analyze the program to identify major performance issues, which, in turn, enables better optimization of the program in shorter developer time.


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