The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2013

Filed:

Apr. 15, 2013
Applicant:

Marvell Israel (M.i.s.l.) Ltd., Yokneam, IL;

Inventors:

Reshef Bar Yoel, Haifa, IL;

Yosef Solt, Atzmon-Segev, IL;

Michael Levi, Beuningen, NE;

Yosef Haviv, Haifa, IL;

Assignee:

Marvell Israel (M.I.S.L) Ltd., Yokneam, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G06F 11/00 (2006.01); G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A memory system includes an array of memory cells and a repair module. Multiple memory cells in the array are redundant to other memory cells in the array. The repair module iteratively tests the array. During the iterative testing of the array, the repair module, during each test of the array, (i) identifies one or more defective memory cells in the array, if any, and (ii) in response to one or more defective memory cells being identified during the test, respectively replaces the one or more defective memory cells with one or more memory cells that are redundant to other memory cells in the array. The repair module performs the iterative testing of the array until (i) the repair module does not detect a defective memory cell or (ii) no memory cells of the memory cells that are redundant remain available for replacement of a defective memory cell.


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