The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2013
Filed:
Oct. 08, 2010
Yasumoto Mori, Joyo, JP;
Daisuke Mitsumoto, Nagaokakyo, JP;
Yasuhiro Ohnishi, Kyotanabe, JP;
Shree Nayar, New York, NY (US);
Yasumoto Mori, Joyo, JP;
Daisuke Mitsumoto, Nagaokakyo, JP;
Yasuhiro Ohnishi, Kyotanabe, JP;
Shree Nayar, New York, NY (US);
Omron Corporation, Kyoto, JP;
Abstract
A surface state inspection apparatus has a lighting device that irradiates an inspection target placed on a stage with light, an imaging device that images the inspection target, and a detection device that detects a surface defect of the inspection target by analyzing a first inspection image obtained by the imaging device. The lighting device is a surface light source that includes a light emission region having a predetermined size and, in the lighting device, portions of light emitted from positions in the light emission region differ from each other in a spectral distribution. The detection device detects a portion in which a hue is different from that of its surrounding portion in the inspection target surface as a flaw. The detection device detects a portion in which the hue is substantially equal to that of its surrounding portion while brightness is different from that of its surrounding portion as a stain.