The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2013

Filed:

Oct. 20, 2004
Applicants:

Eckhard Nordhoff, Berlin, DE;

Alan Bullock, Lunen, DE;

Christine Lubbert, Berlin, DE;

Antonin Schenk, Brno, CZ;

Holger Eickhoff, Syke, DE;

Martin Horn, Berlin, DE;

Inventors:

Eckhard Nordhoff, Berlin, DE;

Alan Bullock, Lunen, DE;

Christine Lubbert, Berlin, DE;

Antonin Schenk, Brno, CZ;

Holger Eickhoff, Syke, DE;

Martin Horn, Berlin, DE;

Assignee:

Scienion AG, Berlin, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for depositing samples, in which at least one sample () is arranged on a substrate (), comprises the following steps: positioning a sample dispenser () above the substrate (), and actuating the sample dispenser () so that the sample () is moved from the sample dispenser () along a trajectory () to a predefined deposition position () on the substrate (), wherein at least part of the trajectory () is shielded against electrical interference fields. Also described is a substrate () for receiving samples (), comprising a substrate body (), on the surface of which at least one deposition position () is provided, and a shielding electrode (), which is designed so as to electrostatically shield the space above the at least one deposition position () against electrical interference fields.


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