The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2013
Filed:
Aug. 30, 2007
Shigeyuki Nakada, Tamano, JP;
Noriaki Kimura, Tamano, JP;
Shigeyuki Nakada, Tamano, JP;
Noriaki Kimura, Tamano, JP;
Mitsui Engineering & Shipbuilding Co., Ltd., Tokyo, JP;
Abstract
When FRET efficiency is measured quantitatively by removing uncertain elements of fluorescence detection information, calibration information prestored in a storage means while including at least the leak rate of donor fluorescence component emitted from a donor molecule, the leak rate of acceptor fluorescence component emitted from an acceptor molecule, and the non-FRET fluorescence lifetime of the donor fluorescence component when FRET is not generated out of the fluorescence of a measurement object sample is acquired. The FRET fluorescence lifetime of the donor fluorescence component is then determined using the intensity information and phase information of fluorescence of the measurement object sample, the leak rate of donor fluorescence component and the leak rate of acceptor fluorescence component, thus determining the FRET fluorescence efficiency.