The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2013
Filed:
Nov. 21, 2006
Volker Lohweg, Bielefeld, DE;
Johannes Georg Schaede, Würzburg, DE;
Thomas Türke, Bielefeld, DE;
KBA-Notasys SA, Lausanne, CH;
Abstract
There is described a method for detection of occurrence of printing errors on printed substrates during processing thereof on a printing press comprising the steps of providing multiple sensors on functional components of the printing press to monitor the behavior of the printing press during processing of the printed substrates and performing an in-line analysis of the behavior of the printing press to determine occurrence of a characteristic behavior of the printing press which leads or is likely to lead to occurrence of printing errors on the printed substrates or which leads or is likely to lead to good printing quality of the printed substrates. In-line analysis of the behavior of the printing press preferably includes performing fuzzy pattern classification of the behavior of the printing press. According to one embodiment of the proposed method in-line analysis of the behavior of the printing press is coupled with an in-line optical inspection of the printed substrates.