The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2013

Filed:

Jan. 14, 2013
Applicants:

Lee Kaufman, Grafton, MA (US);

Mark Ayasse, North Easton, MA (US);

Raymond Johnson, Woburn, MA (US);

Raymond Dufresne, Salem, NH (US);

Inventors:

Lee Kaufman, Grafton, MA (US);

Mark Ayasse, North Easton, MA (US);

Raymond Johnson, Woburn, MA (US);

Raymond Dufresne, Salem, NH (US);

Assignee:

VFA, Inc., Boston, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
Abstract

A system allowing a user to answer a series of questions to generate survey data, associating system data with the survey data to generate a highly accurate report. The user may, customize the survey by selecting categories corresponding to certain series of questions and be presented with a running total of costs associated with each selected action, a total cost for all selected actions, and an impact on the property FCI corresponding to the selected action. The report allows, for example, for targeted assessment of select facilities systems including a time frame within which work to be performed on select facilities systems and/or a cost associated with work to be performed.


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